The A1280A devices were in a CPGA176 package and were active during irradiation. All die were from the Matsushita (MEC) foundry with a 1.0 mm feature size. Upsets and currents were monitored in real-time with the device being clocked at 1 MHz. The stimulation pattern was a 500 kHz square wave. The test pattern used, the TMRA2.C, contains 522 S-Module flip-flops and 40 C-Module flip-flops. Sample devices were taken from several lots used previously in radiation tests along with a few ‘spare devices’ to increase sample size. A total of 19 devices were used in this study. The intent of the study was to investigate the proton response of the hard-wired SModule flip-flops with a large sample size. Previous testing did not detect proton upset within the operating voltage range but used a low fluence. |